SNOSB14D August 2009 – December 2014 LPV521
PRODUCTION DATA.
LPV521 PSPICE Model, SNOM024
TINA-TI SPICE-Based Analog Simulation Program, http://www.ti.com/tool/tina-ti
TI Filterpro Software, http://www.ti.com/tool/filterpro
DIP Adapter Evaluation Module, http://www.ti.com/tool/dip-adapter-evm
TI Universal Operational Amplifier Evaluation Module, http://www.ti.com/tool/opampevm
Evaluation board for 5-pin, north-facing amplifiers in the SC70 package, SNOA487.
Manual for LMH730268 Evaluation board 551012922-001
For related documentation, see the following:
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This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.
ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.
SLYZ022 — TI Glossary.
This glossary lists and explains terms, acronyms, and definitions.