SNVAA05 October   2020 LM60430-Q1 , LM60440-Q1

 

  1. 1Overview
  2. 2Functional Safety Failure In Time (FIT) Rates
  3. 3Failure Mode Distribution (FMD)
  4. 4Pin Failure Mode Analysis (Pin FMA)

1 Overview

This document contains information for LM60430-Q1 and LM60440-Q1 (WQFN-HR package) to aid in a functional safety system design. Information provided are:

  • Functional Safety Failure In Time (FIT) rates of the semiconductor component estimated by the application of industry reliability standards
  • Component failure modes and their distribution (FMD) based on the primary function of the device
  • Pin failure mode analysis (Pin FMA)

Figure 1-1 show the device functional block diagrams for reference.

GUID-20200922-CA0I-LMXJ-L24N-LWV0CPTXQLBW-low.png Figure 1-1 Functional Block Diagram: LM60430-Q1, LM60440-Q1
LM60430-Q1 and LM60440-Q1 were developed using a quality-managed development process, but were not developed in accordance with the ISO 26262 standards.