JAJSIL5A February   2020  – August 2020 ADC12DJ1600-Q1 , ADC12QJ1600-Q1 , ADC12SJ1600-Q1

PRODUCTION DATA  

  1. 特長
  2. アプリケーション
  3. 概要
  4. 概要 (続き)
  5. Revision History
  6. Device Comparison
  7. Pin Configuration and Functions
    1.     Pin Functions
  8. Specifications
    1. 8.1  Absolute Maximum Ratings
    2. 8.2  ESD Ratings
    3. 8.3  Recommended Operating Conditions
    4. 8.4  Thermal Information
    5. 8.5  Electrical Characteristics: DC Specifications
    6. 8.6  ADC12xJ1600-Q1: Electrical Characteristics: Power Consumption
    7. 8.7  ADC12xJ1600-Q1: Electrical Characteristics: AC Specifications
    8. 8.8  Timing Requirements
    9. 8.9  Switching Characteristics
    10. 8.10 Typical Characteristics
  9. Detailed Description
    1. 9.1 Overview
    2. 9.2 Functional Block Diagram
    3. 9.3 Feature Description
      1. 9.3.1 Analog Input
        1. 9.3.1.1 Analog Input Protection
        2. 9.3.1.2 Full-Scale Voltage (VFS) Adjustment
        3. 9.3.1.3 Analog Input Offset Adjust
        4. 9.3.1.4 ADC Core
          1. 9.3.1.4.1 ADC Theory of Operation
          2. 9.3.1.4.2 ADC Core Calibration
          3. 9.3.1.4.3 Analog Reference Voltage
          4. 9.3.1.4.4 ADC Over-range Detection
          5. 9.3.1.4.5 Code Error Rate (CER)
      2. 9.3.2 Temperature Monitoring Diode
      3. 9.3.3 Timestamp
      4. 9.3.4 Clocking
        1. 9.3.4.1 Converter PLL (C-PLL) for Sampling Clock Generation
        2. 9.3.4.2 LVDS Clock Outputs (PLLREFO±, TRIGOUT±)
        3. 9.3.4.3 Optional CMOS Clock Outputs (ORC, ORD)
        4. 9.3.4.4 SYSREF for JESD204C Subclass-1 Deterministic Latency
          1. 9.3.4.4.1 SYSREF Capture for Multi-Device Synchronization and Deterministic Latency
          2. 9.3.4.4.2 SYSREF Position Detector and Sampling Position Selection (SYSREF Windowing)
      5. 9.3.5 JESD204C Interface
        1. 9.3.5.1  Transport Layer
        2. 9.3.5.2  Scrambler
        3. 9.3.5.3  Link Layer
        4. 9.3.5.4  8B/10B Link Layer
          1. 9.3.5.4.1 Data Encoding (8B/10B)
          2. 9.3.5.4.2 Multiiframes and the Local Multiframe Clock (LMFC)
          3. 9.3.5.4.3 Code Group Synchronization (CGS)
          4. 9.3.5.4.4 Initial Lane Alignment Sequence (ILAS)
          5. 9.3.5.4.5 Frame and Multiframe Monitoring
        5. 9.3.5.5  64B/66B Link Layer
          1. 9.3.5.5.1 64B/66B Encoding
          2. 9.3.5.5.2 Multiblocks, Extended Multiblocks and the Local Extended Multiblock Clock (LEMC)
            1. 9.3.5.5.2.1 Block, Multiblock and Extended Multiblock Alignment using Sync Header
              1. 9.3.5.5.2.1.1 Cyclic Redundancy Check (CRC) Mode
              2. 9.3.5.5.2.1.2 Forward Error Correction (FEC) Mode
          3. 9.3.5.5.3 Initial Lane Alignment
          4. 9.3.5.5.4 Block, Multiblock and Extended Multiblock Alignment Monitoring
        6. 9.3.5.6  Physical Layer
          1. 9.3.5.6.1 SerDes Pre-Emphasis
        7. 9.3.5.7  JESD204C Enable
        8. 9.3.5.8  Multi-Device Synchronization and Deterministic Latency
        9. 9.3.5.9  Operation in Subclass 0 Systems
        10. 9.3.5.10 Alarm Monitoring
          1. 9.3.5.10.1 Clock Upset Detection
          2. 9.3.5.10.2 FIFO Upset Detection
    4. 9.4 Device Functional Modes
      1. 9.4.1 Low Power Mode and High Performance Mode
      2. 9.4.2 JESD204C Modes
        1. 9.4.2.1 JESD204C Transport Layer Data Formats
        2. 9.4.2.2 64B/66B Sync Header Stream Configuration
        3. 9.4.2.3 Redundant Data Mode (Alternate Lanes)
      3. 9.4.3 Power-Down Modes
      4. 9.4.4 Test Modes
        1. 9.4.4.1 Serializer Test-Mode Details
        2. 9.4.4.2 PRBS Test Modes
        3. 9.4.4.3 Clock Pattern Mode
        4. 9.4.4.4 Ramp Test Mode
        5. 9.4.4.5 Short and Long Transport Test Mode
          1. 9.4.4.5.1 Short Transport Test Pattern
        6. 9.4.4.6 D21.5 Test Mode
        7. 9.4.4.7 K28.5 Test Mode
        8. 9.4.4.8 Repeated ILA Test Mode
        9. 9.4.4.9 Modified RPAT Test Mode
      5. 9.4.5 Calibration Modes and Trimming
        1. 9.4.5.1 Foreground Calibration Mode
        2. 9.4.5.2 Background Calibration Mode
        3. 9.4.5.3 Low-Power Background Calibration (LPBG) Mode
      6. 9.4.6 Offset Calibration
      7. 9.4.7 Trimming
    5. 9.5 Programming
      1. 9.5.1 Using the Serial Interface
      2. 9.5.2 SCS
      3. 9.5.3 SCLK
      4. 9.5.4 SDI
      5. 9.5.5 SDO
      6. 9.5.6 Streaming Mode
      7. 9.5.7 SPI_Register_Map Registers
  10. 10Application and Implementation
    1. 10.1 Application Information
    2. 10.2 Typical Applications
      1. 10.2.1 Light Detection and Ranging (LiDAR) Digitizer
        1. 10.2.1.1 Design Requirements
        2. 10.2.1.2 Detailed Design Procedure
          1. 10.2.1.2.1 Analog Front-End Requirements
          2. 10.2.1.2.2 Calculating Clock and SerDes Frequencies
        3. 10.2.1.3 Application Curves
    3. 10.3 Initialization Set Up
  11. 11Power Supply Recommendations
    1. 11.1 Power Sequencing
  12. 12Layout
    1. 12.1 Layout Guidelines
    2. 12.2 Layout Example
  13. 13Device and Documentation Support
    1. 13.1 Device Support
    2. 13.2 Receiving Notification of Documentation Updates
    3. 13.3 Support Resources
    4. 13.4 商標
    5. 13.5 静電気放電に関する注意事項
    6. 13.6 Glossary
  14. 14Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Timestamp

The TMSTP+ and TMSTP– differential input can be used as a time-stamp input to mark a specific sample based on the timing of an external trigger event relative to the sampled signal. The TMSTP± input is retimed to the internal sampling clock and can be repeated out of the TRIGOUT± output to trigger external devices, such as a laser driver, when TRIGOUT_EN is set to 1 to enable the TRIGOUT± output and TRIGOUT_MODE is set to 3. The TMSTP± input can also be sent over the JESD204C interface to mark a specific ADC sample. TIME_STAMP_EN must be set in order to output the timestamp data. When enabled, the timestamp signal is sent over the JESD204C interface in place of the LSB of the JESD204C mode sample size (based on N' parameter in Table 9-15, Table 9-16 and Table 9-17). For example, in JMODE 0 the JESD204C sample size (N') is 12 and therefore the timestamp information is sent at LSB ([0]) bit location and the 12-bit sample (truncated to 11-bits) is sent in the [11:1] bit location. The input applied to TMSTP± can be asynchronous to the ADC sampling clock and is sampled at approximately the same time as the analog input. Effectively, the TMSTP± input acts as a 1-bit ADC sampled in parallel with the ADC cores and both have matched latency through the device. The TMSTP± input must be enabled (TMSTP_RECV_EN) to use the timestamp feature.