SBAS547D May   2013  – August 2015 ADS8881

PRODUCTION DATA.  

  1. Features
  2. Applications
  3. Description
  4. Revision History
  5. Companion Products
  6. Device Comparison
  7. Pin Configurations and Functions
  8. Specifications
    1. 8.1 Absolute Maximum Ratings
    2. 8.2 ESD Ratings
    3. 8.3 Recommended Operating Conditions
    4. 8.4 Thermal Information
    5. 8.5 Electrical Characteristics
    6. 8.6 Timing Requirements: 3-Wire Operation
    7. 8.7 Timing Requirements: 4-Wire Operation
    8. 8.8 Timing Requirements: Daisy-Chain
    9. 8.9 Typical Characteristics
  9. Parametric Measurement Information
    1. 9.1 Equivalent Circuits
  10. 10Detailed Description
    1. 10.1 Overview
    2. 10.2 Functional Block Diagram
    3. 10.3 Feature Description
      1. 10.3.1 Analog Input
      2. 10.3.2 Reference
      3. 10.3.3 Clock
      4. 10.3.4 ADC Transfer Function
    4. 10.4 Device Functional Modes
      1. 10.4.1 CS Mode
        1. 10.4.1.1 3-Wire CS Mode Without a Busy Indicator
        2. 10.4.1.2 3-Wire CS Mode With a Busy Indicator
        3. 10.4.1.3 4-Wire CS Mode Without a Busy Indicator
        4. 10.4.1.4 4-Wire CS Mode With a Busy Indicator
      2. 10.4.2 Daisy-Chain Mode
        1. 10.4.2.1 Daisy-Chain Mode Without a Busy Indicator
        2. 10.4.2.2 Daisy-Chain Mode With a Busy Indicator
  11. 11Application and Implementation
    1. 11.1 Application Information
      1. 11.1.1 ADC Reference Driver
      2. 11.1.2 ADC Input Driver
        1. 11.1.2.1 Input Amplifier Selection
        2. 11.1.2.2 Antialiasing Filter
    2. 11.2 Typical Applications
      1. 11.2.1 DAQ Circuit for a 1-µs, Full-Scale Step Response
        1. 11.2.1.1 Design Requirements
        2. 11.2.1.2 Detailed Design Procedure
        3. 11.2.1.3 Application Curve
      2. 11.2.2 Low-Power DAQ Circuit for Excellent Dynamic Performance at 1 MSPS
        1. 11.2.2.1 Design Requirements
        2. 11.2.2.2 Detailed Design Procedure
        3. 11.2.2.3 Application Curve
      3. 11.2.3 DAQ Circuit for Lowest Distortion and Noise Performance at 1 MSPS
        1. 11.2.3.1 Design Requirements
        2. 11.2.3.2 Detailed Design Procedure
        3. 11.2.3.3 Application Curve
      4. 11.2.4 Ultralow-Power DAQ Circuit at 10 kSPS
        1. 11.2.4.1 Design Requirements
        2. 11.2.4.2 Detailed Design Procedure
        3. 11.2.4.3 Application Curve
  12. 12Power-Supply Recommendations
    1. 12.1 Power-Supply Decoupling
    2. 12.2 Power Saving
  13. 13Layout
    1. 13.1 Layout Guidelines
    2. 13.2 Layout Example
  14. 14Device and Documentation Support
    1. 14.1 Device Support
      1. 14.1.1 Development Support
    2. 14.2 Documentation Support
      1. 14.2.1 Related Documentation
    3. 14.3 Receiving Notification of Documentation Updates
    4. 14.4 Community Resources
    5. 14.5 Trademarks
    6. 14.6 Electrostatic Discharge Caution
    7. 14.7 Glossary
  15. 15Mechanical, Packaging, and Orderable Information

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

14 Device and Documentation Support

14.3 Receiving Notification of Documentation Updates

To receive notification of documentation updates, navigate to the device product folder on ti.com. In the upper right corner, click on Alert me to register and receive a weekly digest of any product information that has changed. For change details, review the revision history included in any revised document.

14.4 Community Resources

The following links connect to TI community resources. Linked contents are provided "AS IS" by the respective contributors. They do not constitute TI specifications and do not necessarily reflect TI's views; see TI's Terms of Use.

    TI E2E™ Online Community TI's Engineer-to-Engineer (E2E) Community. Created to foster collaboration among engineers. At e2e.ti.com, you can ask questions, share knowledge, explore ideas and help solve problems with fellow engineers.
    Design Support TI's Design Support Quickly find helpful E2E forums along with design support tools and contact information for technical support.

14.5 Trademarks

E2E is a trademark of Texas Instruments.

SPI is a trademark of Motorola Inc.

TINA is a trademark of Texas Instruments Inc..

All other trademarks are the property of their respective owners.

14.6 Electrostatic Discharge Caution

esds-image

This integrated circuit can be damaged by ESD. Texas Instruments recommends that all integrated circuits be handled with appropriate precautions. Failure to observe proper handling and installation procedures can cause damage.

ESD damage can range from subtle performance degradation to complete device failure. Precision integrated circuits may be more susceptible to damage because very small parametric changes could cause the device not to meet its published specifications.

14.7 Glossary

SLYZ022TI Glossary.

This glossary lists and explains terms, acronyms, and definitions.