JAJSF42B April   2018  – June 2019 DLPC3478

PRODUCTION DATA.  

  1. 特長
  2. アプリケーション
  3. 概要
    1.     Device Images
      1.      標準的なスタンドアロン・システム
  4. 改訂履歴
  5. Pin Configuration and Functions
    1.     Pin Functions – Board Level Test, Debug, and Initialization
    2.     Pin Functions – Parallel Port Input Data and Control
    3.     Pin Functions - DSI Input Data and Clock
    4.     Pin Functions – DMD Reset and Bias Control
    5.     Pin Functions – DMD Sub-LVDS Interface
    6.     Pin Functions – Peripheral Interface
    7.     Pin Functions – GPIO Peripheral Interface
    8.     Pin Functions – Clock and PLL Support
    9.     Pin Functions – Power and Ground
  6. Specifications
    1. 6.1  Absolute Maximum Ratings
    2. 6.2  ESD Ratings
    3. 6.3  Recommended Operating Conditions
    4. 6.4  Thermal Information
    5. 6.5  Electrical Characteristics over Recommended Operating Conditions
    6. 6.6  Electrical Characteristics
    7. 6.7  High-Speed Sub-LVDS Electrical Characteristics
    8. 6.8  Low-Speed SDR Electrical Characteristics
    9. 6.9  System Oscillators Timing Requirements
    10. 6.10 Power-Up and Reset Timing Requirements
    11. 6.11 Parallel Interface Frame Timing Requirements
    12. 6.12 Parallel Interface General Timing Requirements
    13. 6.13 BT656 Interface General Timing Requirements
    14. 6.14 Flash Interface Timing Requirements
  7. Parameter Measurement Information
    1. 7.1 HOST_IRQ Usage Model
    2. 7.2 Input Source
      1. 7.2.1 Input Source - Frame Rates and 3-D Display Orientation
      2. 7.2.2 Parallel Interface Supports Six Data Transfer Formats
        1. 7.2.2.1 PDATA Bus – Parallel Interface Bit Mapping Modes
  8. Detailed Description
    1. 8.1 Overview
    2. 8.2 Functional Block Diagram
    3. 8.3 Feature Description
      1. 8.3.1 Pattern Display
        1. 8.3.1.1 External Pattern Mode
          1. 8.3.1.1.1 8-bit Monochrome Patterns
          2. 8.3.1.1.2 1-Bit Monochrome Patterns
        2. 8.3.1.2 Internal Pattern Mode
          1. 8.3.1.2.1 Free Running Mode
          2. 8.3.1.2.2 Trigger In Mode
      2. 8.3.2 Interface Timing Requirements
        1. 8.3.2.1 Parallel Interface
    4. 8.4 Serial Flash Interface
      1. 8.4.1  Serial Flash Programming
      2. 8.4.2  SPI Signal Routing
      3. 8.4.3  I2C Interface Performance
      4. 8.4.4  Content-Adaptive Illumination Control
      5. 8.4.5  Local Area Brightness Boost
      6. 8.4.6  3-D Glasses Operation
      7. 8.4.7  DMD (Sub-LVDS) Interface
      8. 8.4.8  Calibration and Debug Support
      9. 8.4.9  DMD Interface Considerations
      10. 8.4.10 Device Functional Modes
  9. Application and Implementation
    1. 9.1 Application Information
      1. 9.1.1 DLPC3478 System Design Consideration
    2. 9.2 Typical Application
      1. 9.2.1 3D Depth Scanner with DLP Using External Pattern Streaming Mode
        1. 9.2.1.1 Design Requirements
        2. 9.2.1.2 Detailed Design Procedure
        3. 9.2.1.3 Application Curve
      2. 9.2.2 3D Depth Scanner Using Internal Pattern Streaming Mode
        1. 9.2.2.1 Design Requirements
        2. 9.2.2.2 Detailed Design Procedure
        3. 9.2.2.3 Application Curve
  10. 10Power Supply Recommendations
    1. 10.1 System Power-Up and Power-Down Sequence
    2. 10.2 DLPC3478 Power-Up Initialization Sequence
    3. 10.3 DMD Fast PARK Control (PARKZ)
    4. 10.4 Hot Plug Usage
    5. 10.5 Maximum Signal Transition Time
  11. 11Layout
    1. 11.1 Layout Guidelines
      1. 11.1.1 PCB Layout Guidelines for Internal ASIC PLL Power
      2. 11.1.2 DLPC3478 Reference Clock
        1. 11.1.2.1 Recommended Crystal Oscillator Configuration
      3. 11.1.3 General PCB Recommendations
      4. 11.1.4 General Handling Guidelines for Unused CMOS-Type Pins
      5. 11.1.5 Maximum Pin-to-Pin, PCB Interconnects Etch Lengths
      6. 11.1.6 Number of Layer Changes
      7. 11.1.7 Stubs
      8. 11.1.8 Terminations
      9. 11.1.9 Routing Vias
    2. 11.2 Layout Example
    3. 11.3 Thermal Considerations
  12. 12デバイスおよびドキュメントのサポート
    1. 12.1 デバイス・サポート
      1. 12.1.1 デベロッパー・ネットワークの製品に関する免責事項
      2. 12.1.2 デバイスの項目表記
        1. 12.1.2.1 デバイスのマーキング
      3. 12.1.3 ビデオ・タイミング・パラメータの定義
    2. 12.2 関連リンク
    3. 12.3 コミュニティ・リソース
    4. 12.4 商標
    5. 12.5 静電気放電に関する注意事項
    6. 12.6 Glossary
  13. 13メカニカル、パッケージ、および注文情報

パッケージ・オプション

メカニカル・データ(パッケージ|ピン)
サーマルパッド・メカニカル・データ
発注情報

Calibration and Debug Support

The DLPC3478 device contains a test point output port, TSTPT_(7:0), which provides selected system calibration support as well as ASIC debug support. These test points are inputs while reset is applied and switch to outputs when reset is released. The state of these signals is sampled upon the release of system reset and the captured value configures the test mode until the next time reset is applied. Each test point includes an internal pulldown resistor, thus external pullups must be used to modify the default test configuration. The default configuration (x000) corresponds to the TSTPT_(7:0) outputs remaining tri-stated to reduce switching activity during normal operation. For maximum flexibility, an option to jumper to an external pullup is recommended for TSTPT_(2:0). Pullups on TSTPT_(6:3) are used to configure the ASIC for a specific mode or option. TI does not recommend adding pullups to TSTPT_(7:3) because this has adverse affects for normal operation. This external pullup value is sampled only during a 0-to-1 transition on the RESETZ input, thus changing the configuration after reset is released and has no effect until the next time reset is asserted and released. Table 11 defines the test mode selection for one programmable scenario defined by TSTPT(2:0).

Table 11. Test Mode Selection Scenario Defined by TSTPT(2:0)(1)

TSTPT(2:0) CAPTURE VALUE NO SWITCHING ACTIVITY CLOCK DEBUG OUTPUT
x000 x010
TSTPT(0) HI-Z 60 MHz
TSTPT(1) HI-Z 30 MHz
TSTPT(2) HI-Z 0.7 to 22.5 MHz
TSTPT(3) HI-Z HIGH
TSTPT(4) HI-Z LOW
TSTPT(5) HI-Z HIGH
TSTPT(6) HI-Z HIGH
TSTPT(7) HI-Z 7.5 MHz
These are only the default output selections. Software can reprogram the selection at any time.